Various port attributes can be configured using the PORT_PAD_CTL settings, e.g. enabling the Schmitt trigger, setting drive strength and so on.
Another parameter is slew rate control, where I believe 1 = no slew rate control (i.e. fast edges) and 0 = slow edges.
I've been playing around with these settings using my oscilloscope, measuring edge rise/fall speed as well as slew rate (which is just derived from the rise/fall time) on various clock and data line edges.
Changing drive strength certainly changes the values that I am measuring, but whether I set slew rate control to 0 or 1 doesn't seem to change the measured rise/fall time/slew rate at all.
What measurable parameter does slew rate control affect?
			
			
									
							
		[XU316] What exactly does slew rate control in PORT_PAD_CTL? Topic is solved
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				michaelf
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				JoeVerified
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Hi, as you've noticed, setting slow slew rate has very little effect. If you are in the highest drive strength modes say 12mA and you are driving a low capacitance load (5pF or less) then you will see the edges do get slower. You would need a high speed scope with low capacitance probe to see this though.
Best to leave slew rate set to default (fast).
Cheers,
Joe
			
			
									
										Best to leave slew rate set to default (fast).
Cheers,
Joe
XMOS hardware grey beard.
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				michaelf
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Thanks for clarifying.
			
			
									
										
						